A 1/1.8" 3M pixel FT-CCD with on-chip horizontal sub-sampling for DSC applications

L Le Cam; JT Bosiers; AC Kleimann; HC van Kuijk; JP Maas; MJ Beenhakkers; HL Peek; PC van de Rijt; AJP Theuwissen

A 1/1.8" 3M pixel FT-CCD with on-chip horizontal sub-sampling for DSC applications

L Le Cam, JT Bosiers, AC Kleimann, HC van Kuijk, JP Maas, MJ Beenhakkers, HL Peek, PC van de Rijt, AJP Theuwissen

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

7 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	2002 IEEE International solid-state circuits conference: 2002 Digest of technical papers
Editors	JH Wuorinen
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	34-35
Number of pages	2
ISBN (Print)	0-7803-7335-9
Publication status	Published - 2002
Event	2002 IEEE International Solid-State Circuits Conference - Piscataway, NJ, USA Duration: 3 Feb 2002 → 7 Feb 2002

Publication series

Name
Publisher	IEEE

Name
Volume	45

Conference

Conference	2002 IEEE International Solid-State Circuits Conference
Period	3/02/02 → 7/02/02

Bibliographical note

plus page 442

Keywords

Elektrotechniek
Techniek
Geen BTA classificatie
ZX Int.klas.verslagjaar < 2002

Cite this

Le Cam, L ; Bosiers, JT ; Kleimann, AC ; van Kuijk, HC ; Maas, JP ; Beenhakkers, MJ ; Peek, HL ; van de Rijt, PC ; Theuwissen, AJP. / A 1/1.8" 3M pixel FT-CCD with on-chip horizontal sub-sampling for DSC applications. 2002 IEEE International solid-state circuits conference: 2002 Digest of technical papers. editor / JH Wuorinen. Piscataway, NJ, USA : IEEE Society, 2002. pp. 34-35

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title = "A 1/1.8{"} 3M pixel FT-CCD with on-chip horizontal sub-sampling for DSC applications",

keywords = "Elektrotechniek, Techniek, Geen BTA classificatie, ZX Int.klas.verslagjaar < 2002",

author = "{Le Cam}, L and JT Bosiers and AC Kleimann and {van Kuijk}, HC and JP Maas and MJ Beenhakkers and HL Peek and {van de Rijt}, PC and AJP Theuwissen",

note = "plus page 442; null ; Conference date: 03-02-2002 Through 07-02-2002",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7803-7335-9",

publisher = "IEEE Society",

pages = "34--35",

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Le Cam, L, Bosiers, JT, Kleimann, AC, van Kuijk, HC, Maas, JP, Beenhakkers, MJ, Peek, HL, van de Rijt, PC & Theuwissen, AJP 2002, A 1/1.8" 3M pixel FT-CCD with on-chip horizontal sub-sampling for DSC applications. in JH Wuorinen (ed.), 2002 IEEE International solid-state circuits conference: 2002 Digest of technical papers. IEEE Society, Piscataway, NJ, USA, pp. 34-35, 2002 IEEE International Solid-State Circuits Conference, 3/02/02.

A 1/1.8" 3M pixel FT-CCD with on-chip horizontal sub-sampling for DSC applications. / Le Cam, L; Bosiers, JT; Kleimann, AC; van Kuijk, HC; Maas, JP; Beenhakkers, MJ; Peek, HL; van de Rijt, PC; Theuwissen, AJP.

2002 IEEE International solid-state circuits conference: 2002 Digest of technical papers. ed. / JH Wuorinen. Piscataway, NJ, USA : IEEE Society, 2002. p. 34-35.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - A 1/1.8" 3M pixel FT-CCD with on-chip horizontal sub-sampling for DSC applications

AU - Le Cam, L

AU - Bosiers, JT

AU - Kleimann, AC

AU - van Kuijk, HC

AU - Maas, JP

AU - Beenhakkers, MJ

AU - Peek, HL

AU - van de Rijt, PC

AU - Theuwissen, AJP

N1 - plus page 442

PY - 2002

Y1 - 2002

KW - Elektrotechniek

KW - Techniek

KW - Geen BTA classificatie

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-7335-9

SP - 34

EP - 35

BT - 2002 IEEE International solid-state circuits conference: 2002 Digest of technical papers

A2 - Wuorinen, JH

PB - IEEE Society

CY - Piscataway, NJ, USA

Y2 - 3 February 2002 through 7 February 2002

ER -