A 21-bit Read-Out IC Employing Dynamic Element Matching with 0.037% Gain Error

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Title of host publication2011 IEEE Asian Solid-State Circuits Conference
EditorsK-N Kim, S-I Liu
Place of PublicationJeju, Korea
PublisherIEEE Society
Pages241-244
Number of pages4
ISBN (Print)978-1-4577-1785-7
DOIs
Publication statusPublished - 2011
EventIEEE A-SSCC 2011 - Jeju, Korea
Duration: 14 Nov 201116 Nov 2011

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE A-SSCC 2011
Period14/11/1116/11/11

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