Abstract
This paper presents a 210nW BJT-based temperature sensor that achieves an inaccuracy of ±0.15°C (3s) from -15°C to 85°C. A dual-mode front-end (FE), which combines a bias circuit and a BJT core, halves the power needed to generate well-defined CTAT (VBE) and PTAT (?VBE) voltages. The use of a tracking ?S ADC reduces FE signal swing and further reduces system power consumption. In a 180-nm BCD process, the prototype achieves a 15mK resolution in 50ms conversion time, translating into a state-of-the-art FoM of 2.3pJK2.
Original language | English |
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Title of host publication | 2022 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2022 |
Place of Publication | Piscataway, NJ, USA |
Publisher | IEEE |
Pages | 120-121 |
Number of pages | 2 |
ISBN (Electronic) | 978-1-6654-9772-5 |
DOIs | |
Publication status | Published - 2022 |
Event | 2022 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2022 - Honolulu, United States Duration: 12 Jun 2022 → 17 Jun 2022 |
Publication series
Name | Digest of Technical Papers - Symposium on VLSI Technology |
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Volume | 2022-June |
ISSN (Print) | 0743-1562 |
Conference
Conference | 2022 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2022 |
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Country/Territory | United States |
City | Honolulu |
Period | 12/06/22 → 17/06/22 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.