A 40-nm CMOS Complex Permittivity Sensing Pixel for Material Characterization at Microwave Frequencies

Gerasimos Vlachogiannakis, Michiel A.P. Pertijs, Marco Spirito, Leo C.N. de Vreede

Research output: Contribution to journal › Article › Scientific › peer-review

9 Citations (Scopus)
113 Downloads (Pure)

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