A back-wafer contacted silicon-on-glass integrated bipolar process - Part II: a novel analysis of thermal breakdown

N Nenadovic, V d' Alessandro, LK Nanver, F Tamigi, N Rinaldi, JW Slotboom

Research output: Contribution to journalArticleScientificpeer-review

60 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)51-62
Number of pages12
JournalIEEE Transactions on Electron Devices
Volume51
Issue number1
Publication statusPublished - 2004

Keywords

  • academic journal papers
  • ZX CWTS 1.00 <= JFIS < 3.00

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