A Benchmark of Cryo-CMOS 40-nm Embedded SRAM/DRAMs for Quantum Computing

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Abstract

The cryogenic electronic interface for quantum pro-cessors requires cryo-CMOS embedded memories that cover a wide range of specifications. The temperature dependence of device parameters, such as the threshold voltage, the gate/subthreshold leakage, and the variability, severely alters the memories' performance between room temperature (RT) and cryogenic temperatures (4.2K). To assess the best memory design for a given application, this paper benchmarks three custom DRAMs and a custom SRAM in 40-nm CMOS at 4.2 K and RT, e.g., identifying that, while the SRAM is more power efficient for moderate-to-high speeds at RT, the 2T DRAM performs better than SRAM and 3T DRAMs at 4.2 K.

Original languageEnglish
Title of host publicationESSCIRC 2023 - IEEE 49th European Solid State Circuits Conference
PublisherIEEE
Pages165-168
Number of pages4
ISBN (Electronic)9798350304206
DOIs
Publication statusPublished - 2023
Event49th IEEE European Solid State Circuits Conference, ESSCIRC 2023 - Lisbon, Portugal
Duration: 11 Sept 202314 Sept 2023

Publication series

NameEuropean Solid-State Circuits Conference
Volume2023-September
ISSN (Print)1930-8833

Conference

Conference49th IEEE European Solid State Circuits Conference, ESSCIRC 2023
Country/TerritoryPortugal
CityLisbon
Period11/09/2314/09/23

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • Cryo-CMOS
  • DRAM
  • eDRAM
  • SRAM

Fingerprint

Dive into the research topics of 'A Benchmark of Cryo-CMOS 40-nm Embedded SRAM/DRAMs for Quantum Computing'. Together they form a unique fingerprint.

Cite this