A case study of ESD failures at random levels: analysis, explanation and solution

HC Wu, T Smedes, JP extern Lokker, S-N Mei, JW Slotboom

Research output: Contribution to journalArticleScientificpeer-review

Original languageUndefined/Unknown
Pages (from-to)1823-1827
Number of pages5
JournalMicroelectronics Reliability
Volume44
Publication statusPublished - 2004

Keywords

  • academic journal papers
  • ZX CWTS JFIS < 1.00

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