A case study of ESD failures at random levels: analysis, explanation and solution

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	1823-1827
Number of pages	5
Journal	Microelectronics Reliability
Volume	44
Publication status	Published - 2004

Keywords

@article{84e15eb49dd14348a55eafad3ff5fbd3,

title = "A case study of ESD failures at random levels: analysis, explanation and solution",

keywords = "academic journal papers, ZX CWTS JFIS < 1.00",

author = "HC Wu and T Smedes and Lokker, \{JP extern\} and S-N Mei and JW Slotboom",

year = "2004",

language = "Undefined/Unknown",

volume = "44",

pages = "1823--1827",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

}

TY - JOUR

T1 - A case study of ESD failures at random levels: analysis, explanation and solution

AU - Wu, HC

AU - Smedes, T

AU - Lokker, JP extern

AU - Mei, S-N

AU - Slotboom, JW

PY - 2004

Y1 - 2004

KW - academic journal papers

KW - ZX CWTS JFIS < 1.00

M3 - Article

SN - 0026-2714

VL - 44

SP - 1823

EP - 1827

JO - Microelectronics Reliability

JF - Microelectronics Reliability

ER -