Abstract
To comply with wired communication standards such as USB, SATA and PCI/PCI-E, systems-on-chip require frequency references with better than 300ppm accuracy. LC-based references achieve 100ppm accuracy [1], but suffer from high power consumption (∼20mW). Thermal diffusivity (TD) references require less power (∼2mW), at the expense of less accuracy (1000ppm) [2]. RC-based references offer the lowest power consumption, but their accuracy is typically limited to ∼0.1% [3]. In RC relaxation oscillators, comparator offset and delay are the major sources of inaccuracy [4,5]. References based on frequency-locked loops (FLLs) circumvent these by locking an oscillator's frequency to the time-constant of an RC filter, but their accuracy is then limited by the nonlinear temperature dependency of on-chip resistors [3,6].
Original language | English |
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Title of host publication | 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018 |
Subtitle of host publication | Digest of technical papers |
Editors | L.J. Fujino |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
Pages | 54-56 |
Number of pages | 3 |
Volume | 61 |
ISBN (Electronic) | 978-1-5090-4940-0 |
ISBN (Print) | 978-1-5386-2227-8 |
DOIs | |
Publication status | Published - 2018 |
Event | 65th IEEE International Solid-State Circuits Conference, ISSCC 2018 - San Francisco, United States Duration: 11 Feb 2018 → 15 Feb 2018 |
Conference
Conference | 65th IEEE International Solid-State Circuits Conference, ISSCC 2018 |
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Country/Territory | United States |
City | San Francisco |
Period | 11/02/18 → 15/02/18 |
Bibliographical note
Session 3.3Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Keywords
- Frequency locked loops
- Oscillators
- Temperature measurement
- Jitter
- Resistors
- Circuit stability
- Thermal stability