A CMOS Dual-RC frequency reference with ±250ppm inaccuracy from -45°C to 85°C

Çağri Gürleyük; Lorenzo Pedalà; Fabio Sebastiano; Kofi A.A. Makinwa

doi:10.1109/ISSCC.2018.8310180

A CMOS Dual-RC frequency reference with ±250ppm inaccuracy from -45°C to 85°C

Çağri Gürleyük
, Lorenzo Pedalà
, Fabio Sebastiano
, Kofi A.A. Makinwa

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

6 Citations (Scopus)

150 Downloads (Pure)

Abstract

To comply with wired communication standards such as USB, SATA and PCI/PCI-E, systems-on-chip require frequency references with better than 300ppm accuracy. LC-based references achieve 100ppm accuracy [1], but suffer from high power consumption (∼20mW). Thermal diffusivity (TD) references require less power (∼2mW), at the expense of less accuracy (1000ppm) [2]. RC-based references offer the lowest power consumption, but their accuracy is typically limited to ∼0.1% [3]. In RC relaxation oscillators, comparator offset and delay are the major sources of inaccuracy [4,5]. References based on frequency-locked loops (FLLs) circumvent these by locking an oscillator's frequency to the time-constant of an RC filter, but their accuracy is then limited by the nonlinear temperature dependency of on-chip resistors [3,6].

Original language	English
Title of host publication	2018 IEEE International Solid-State Circuits Conference, ISSCC 2018
Subtitle of host publication	Digest of technical papers
Editors	L.J. Fujino
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	54-56
Number of pages	3
Volume	61
ISBN (Electronic)	978-1-5090-4940-0
ISBN (Print)	978-1-5386-2227-8
DOIs	https://doi.org/10.1109/ISSCC.2018.8310180
Publication status	Published - 2018
Event	65th IEEE International Solid-State Circuits Conference, ISSCC 2018 - San Francisco, United States Duration: 11 Feb 2018 → 15 Feb 2018

Conference

Conference	65th IEEE International Solid-State Circuits Conference, ISSCC 2018
Country/Territory	United States
City	San Francisco
Period	11/02/18 → 15/02/18

Bibliographical note

Session 3.3
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

Frequency locked loops
Oscillators
Temperature measurement
Jitter
Resistors
Circuit stability
Thermal stability

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10.1109/ISSCC.2018.8310180

08310180Final published version, 0.99 MB

Cite this

@inproceedings{6c197cd5de104031b63130b8a2478798,

title = "A CMOS Dual-RC frequency reference with ±250ppm inaccuracy from -45°C to 85°C",

abstract = "To comply with wired communication standards such as USB, SATA and PCI/PCI-E, systems-on-chip require frequency references with better than 300ppm accuracy. LC-based references achieve 100ppm accuracy [1], but suffer from high power consumption (∼20mW). Thermal diffusivity (TD) references require less power (∼2mW), at the expense of less accuracy (1000ppm) [2]. RC-based references offer the lowest power consumption, but their accuracy is typically limited to ∼0.1\% [3]. In RC relaxation oscillators, comparator offset and delay are the major sources of inaccuracy [4,5]. References based on frequency-locked loops (FLLs) circumvent these by locking an oscillator's frequency to the time-constant of an RC filter, but their accuracy is then limited by the nonlinear temperature dependency of on-chip resistors [3,6].",

keywords = "Frequency locked loops, Oscillators, Temperature measurement, Jitter, Resistors, Circuit stability, Thermal stability",

author = "{\c C}ağri G{\"u}rley{\"u}k and Lorenzo Pedal{\`a} and Fabio Sebastiano and Makinwa, \{Kofi A.A.\}",

note = "Session 3.3 Green Open Access added to TU Delft Institutional Repository {\textquoteleft}You share, we take care!{\textquoteright} – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. ; 65th IEEE International Solid-State Circuits Conference, ISSCC 2018 ; Conference date: 11-02-2018 Through 15-02-2018",

year = "2018",

doi = "10.1109/ISSCC.2018.8310180",

language = "English",

isbn = "978-1-5386-2227-8",

volume = "61",

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editor = "L.J. Fujino",

booktitle = "2018 IEEE International Solid-State Circuits Conference, ISSCC 2018",

publisher = "IEEE",

address = "United States",

}

Gürleyük, Ç, Pedalà, L, Sebastiano, F & Makinwa, KAA 2018, A CMOS Dual-RC frequency reference with ±250ppm inaccuracy from -45°C to 85°C. in LJ Fujino (ed.), 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018: Digest of technical papers. vol. 61, IEEE, Piscataway, NJ, pp. 54-56, 65th IEEE International Solid-State Circuits Conference, ISSCC 2018, San Francisco, United States, 11/02/18. https://doi.org/10.1109/ISSCC.2018.8310180

A CMOS Dual-RC frequency reference with ±250ppm inaccuracy from -45°C to 85°C. / Gürleyük, Çağri; Pedalà, Lorenzo; Sebastiano, Fabio et al.
2018 IEEE International Solid-State Circuits Conference, ISSCC 2018: Digest of technical papers. ed. / L.J. Fujino. Vol. 61 Piscataway, NJ: IEEE, 2018. p. 54-56.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - A CMOS Dual-RC frequency reference with ±250ppm inaccuracy from -45°C to 85°C

AU - Gürleyük, Çağri

AU - Pedalà, Lorenzo

AU - Sebastiano, Fabio

AU - Makinwa, Kofi A.A.

N1 - Session 3.3 Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

PY - 2018

Y1 - 2018

N2 - To comply with wired communication standards such as USB, SATA and PCI/PCI-E, systems-on-chip require frequency references with better than 300ppm accuracy. LC-based references achieve 100ppm accuracy [1], but suffer from high power consumption (∼20mW). Thermal diffusivity (TD) references require less power (∼2mW), at the expense of less accuracy (1000ppm) [2]. RC-based references offer the lowest power consumption, but their accuracy is typically limited to ∼0.1% [3]. In RC relaxation oscillators, comparator offset and delay are the major sources of inaccuracy [4,5]. References based on frequency-locked loops (FLLs) circumvent these by locking an oscillator's frequency to the time-constant of an RC filter, but their accuracy is then limited by the nonlinear temperature dependency of on-chip resistors [3,6].

AB - To comply with wired communication standards such as USB, SATA and PCI/PCI-E, systems-on-chip require frequency references with better than 300ppm accuracy. LC-based references achieve 100ppm accuracy [1], but suffer from high power consumption (∼20mW). Thermal diffusivity (TD) references require less power (∼2mW), at the expense of less accuracy (1000ppm) [2]. RC-based references offer the lowest power consumption, but their accuracy is typically limited to ∼0.1% [3]. In RC relaxation oscillators, comparator offset and delay are the major sources of inaccuracy [4,5]. References based on frequency-locked loops (FLLs) circumvent these by locking an oscillator's frequency to the time-constant of an RC filter, but their accuracy is then limited by the nonlinear temperature dependency of on-chip resistors [3,6].

KW - Frequency locked loops

KW - Oscillators

KW - Temperature measurement

KW - Jitter

KW - Resistors

KW - Circuit stability

KW - Thermal stability

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M3 - Conference contribution

AN - SCOPUS:85046397168

SN - 978-1-5386-2227-8

VL - 61

SP - 54

EP - 56

BT - 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018

A2 - Fujino, L.J.

PB - IEEE

CY - Piscataway, NJ

T2 - 65th IEEE International Solid-State Circuits Conference, ISSCC 2018

Y2 - 11 February 2018 through 15 February 2018

ER -

A CMOS Dual-RC frequency reference with ±250ppm inaccuracy from -45°C to 85°C

Abstract

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Bibliographical note

Keywords

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