A CMOS image sensor with row and column profiling means

N Xie, AJP Theuwissen, X Wang, J Leijtens, H Hakkesteegt, H Jansen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

18 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of IEEE Sensors 2008
PublisherIEEE Sensors
Pages1356-1359
Number of pages4
ISBN (Print)978-1-4244-2581-5
Publication statusPublished - 2008
EventIEEE Sensors 2008 - Lecce, Italy
Duration: 26 Oct 200829 Oct 2008

Conference

ConferenceIEEE Sensors 2008
CountryItaly
CityLecce
Period26/10/0829/10/08

Keywords

  • Elektrotechniek
  • Techniek
  • conference contrib. refereed
  • Conf.proc. > 3 pag

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