A CMOS smart temperature sensor with a batch-calibrated inaccuracy of ± 0.25 degree celsius (3 sigma) from -70 degree celsius to 130 degree celsius

AL Aita; MAP Pertijs; KAA Makinwa; JH Huijsing

A CMOS smart temperature sensor with a batch-calibrated inaccuracy of ± 0.25 degree celsius (3 sigma) from -70 degree celsius to 130 degree celsius

AL Aita, MAP Pertijs, KAA Makinwa, JH Huijsing

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of ISSCC 2009
Editors	s.n.
Place of Publication	USA
Publisher	ISSCC
Pages	342-344
Number of pages	3
ISBN (Print)	978-1-4244-3457-2
Publication status	Published - 2009
Event	International solid-state circuits conference 2009 - USA Duration: 8 Feb 2009 → 12 Feb 2009

Publication series

Name
Publisher	ISSCC

Conference

Conference	International solid-state circuits conference 2009
Period	8/02/09 → 12/02/09

Keywords

conference contrib. refereed
Geen BTA classificatie

Cite this

@inproceedings{d719cc73ba2f4d58a18df3ed96b2b663,

title = "A CMOS smart temperature sensor with a batch-calibrated inaccuracy of ± 0.25 degree celsius (3 sigma) from -70 degree celsius to 130 degree celsius",

keywords = "conference contrib. refereed, Geen BTA classificatie",

author = "AL Aita and MAP Pertijs and KAA Makinwa and JH Huijsing",

year = "2009",

language = "Undefined/Unknown",

isbn = "978-1-4244-3457-2",

publisher = "ISSCC",

pages = "342--344",

editor = "s.n.",

booktitle = "Proceedings of ISSCC 2009",

note = "International solid-state circuits conference 2009 ; Conference date: 08-02-2009 Through 12-02-2009",

}

A CMOS smart temperature sensor with a batch-calibrated inaccuracy of ± 0.25 degree celsius (3 sigma) from -70 degree celsius to 130 degree celsius. / Aita, AL; Pertijs, MAP ; Makinwa, KAA et al.
Proceedings of ISSCC 2009. ed. / s.n. USA: ISSCC, 2009. p. 342-344.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - A CMOS smart temperature sensor with a batch-calibrated inaccuracy of ± 0.25 degree celsius (3 sigma) from -70 degree celsius to 130 degree celsius

AU - Aita, AL

AU - Pertijs, MAP

AU - Makinwa, KAA

AU - Huijsing, JH

PY - 2009

Y1 - 2009

KW - conference contrib. refereed

KW - Geen BTA classificatie

M3 - Conference contribution

SN - 978-1-4244-3457-2

SP - 342

EP - 344

BT - Proceedings of ISSCC 2009

A2 - s.n., null

PB - ISSCC

CY - USA

T2 - International solid-state circuits conference 2009

Y2 - 8 February 2009 through 12 February 2009

ER -