A combined BEM/FEM method for IC substrate modeling

E Schrik

Research output: ThesisDissertation (TU Delft)

Original languageUndefined/Unknown
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Dewilde, P.M.R.J.O., Supervisor
  • van der Meijs, N.P., Advisor
Award date11 Sep 2006
Place of PublicationDelft
Publisher
Publication statusPublished - 2006

Keywords

  • Diss. prom. aan TU Delft

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