A combined design-time/test-time study of the vulnerability of sub-threshold devices to low voltage fault attacks

A Barenghi, C Hocquet, D Bol, FX Standaert, F Regazzoni, I Koren

Research output: Contribution to journalArticleScientificpeer-review

10 Citations (Scopus)
20 Downloads (Pure)
Original languageEnglish
Pages (from-to)107-118
Number of pages12
JournalIEEE Transactions on Emerging Topics in Computing
Volume2
Issue number2
DOIs
Publication statusPublished - 2014

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