A combined design-time/test-time study of the vulnerability of sub-threshold devices to low voltage fault attacks

A Barenghi; C Hocquet; D Bol; FX Standaert; F Regazzoni; I Koren

doi:10.1109/TETC.2014.2316509

A combined design-time/test-time study of the vulnerability of sub-threshold devices to low voltage fault attacks

A Barenghi, C Hocquet, D Bol, FX Standaert, F Regazzoni, I Koren

Circuits and Systems

Research output: Contribution to journal › Article › Scientific › peer-review

10 Citations (Scopus)

20 Downloads (Pure)

Original language	English
Pages (from-to)	107-118
Number of pages	12
Journal	IEEE Transactions on Emerging Topics in Computing
Volume	2
Issue number	2
DOIs	https://doi.org/10.1109/TETC.2014.2316509
Publication status	Published - 2014

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10.1109/TETC.2014.2316509

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Cite this

@article{d4979779286c4f608cda0305f6886913,

title = "A combined design-time/test-time study of the vulnerability of sub-threshold devices to low voltage fault attacks",

author = "A Barenghi and C Hocquet and D Bol and FX Standaert and F Regazzoni and I Koren",

note = "Harvest",

year = "2014",

doi = "10.1109/TETC.2014.2316509",

language = "English",

volume = "2",

pages = "107--118",

journal = "IEEE Transactions on Emerging Topics in Computing",

issn = "2168-6750",

publisher = "IEEE ",

number = "2",

}

TY - JOUR

T1 - A combined design-time/test-time study of the vulnerability of sub-threshold devices to low voltage fault attacks

AU - Barenghi, A

AU - Hocquet, C

AU - Bol, D

AU - Standaert, FX

AU - Regazzoni, F

AU - Koren, I

N1 - Harvest

PY - 2014

Y1 - 2014

UR - http://resolver.tudelft.nl/uuid:d4979779-286c-4f60-8cda-0305f6886913

U2 - 10.1109/TETC.2014.2316509

DO - 10.1109/TETC.2014.2316509

M3 - Article

VL - 2

SP - 107

EP - 118

JO - IEEE Transactions on Emerging Topics in Computing

JF - IEEE Transactions on Emerging Topics in Computing

SN - 2168-6750

IS - 2

ER -