A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique

X. Ge; Bastien Mamdy; A.J.P. Theuwissen

doi:10.2352/ISSN.2470-1173.2016.12.IMSE-282

A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique

Electronic Instrumentation

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Abstract

This paper presents a noise analysis and noise measurementsof n-type and p-type pixels with correlated multiple sampling(CMS) technique. The output noise power spectral density (PSD)of both pixel types with different CMS noise reduction factors havebeen simulated and calculated in the spectral domain. Forvalidation, two groups of test pixel have been fabricated with astate-of-the-art n-type and p-type CMOS image sensor (CIS)technology. The calculated and the measured noise results withCMS show a good agreement. Measurement results also show thatthe n-type and p-type pixels reach a 1.1 e- and 0.88 h+ inputreferredtemporal noise respectively with a board-level 64 timesdigital CMS and ×6 analog gain.

Original language	English
Title of host publication	Electronic Imaging
Subtitle of host publication	Image Sensors and Imaging Systems 2016
Publisher	SPIE
Pages	1-6
Number of pages	6
DOIs	https://doi.org/10.2352/ISSN.2470-1173.2016.12.IMSE-282
Publication status	Published - 14 Feb 2016
Event	2016 IS&T International Symposium on Electronic Imaging - San Francisco, CA, United States Duration: 14 Feb 2016 → 18 Feb 2016 http://www.electronicimaging.org/

Conference

Conference	2016 IS&T International Symposium on Electronic Imaging
Country/Territory	United States
City	San Francisco, CA
Period	14/02/16 → 18/02/16
Internet address	http://www.electronicimaging.org/

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title = "A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique",

abstract = "This paper presents a noise analysis and noise measurementsof n-type and p-type pixels with correlated multiple sampling(CMS) technique. The output noise power spectral density (PSD)of both pixel types with different CMS noise reduction factors havebeen simulated and calculated in the spectral domain. Forvalidation, two groups of test pixel have been fabricated with astate-of-the-art n-type and p-type CMOS image sensor (CIS)technology. The calculated and the measured noise results withCMS show a good agreement. Measurement results also show thatthe n-type and p-type pixels reach a 1.1 e- and 0.88 h+ inputreferredtemporal noise respectively with a board-level 64 timesdigital CMS and ×6 analog gain.",

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AU - Mamdy, Bastien

AU - Theuwissen, A.J.P.

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N2 - This paper presents a noise analysis and noise measurementsof n-type and p-type pixels with correlated multiple sampling(CMS) technique. The output noise power spectral density (PSD)of both pixel types with different CMS noise reduction factors havebeen simulated and calculated in the spectral domain. Forvalidation, two groups of test pixel have been fabricated with astate-of-the-art n-type and p-type CMOS image sensor (CIS)technology. The calculated and the measured noise results withCMS show a good agreement. Measurement results also show thatthe n-type and p-type pixels reach a 1.1 e- and 0.88 h+ inputreferredtemporal noise respectively with a board-level 64 timesdigital CMS and ×6 analog gain.

AB - This paper presents a noise analysis and noise measurementsof n-type and p-type pixels with correlated multiple sampling(CMS) technique. The output noise power spectral density (PSD)of both pixel types with different CMS noise reduction factors havebeen simulated and calculated in the spectral domain. Forvalidation, two groups of test pixel have been fabricated with astate-of-the-art n-type and p-type CMOS image sensor (CIS)technology. The calculated and the measured noise results withCMS show a good agreement. Measurement results also show thatthe n-type and p-type pixels reach a 1.1 e- and 0.88 h+ inputreferredtemporal noise respectively with a board-level 64 timesdigital CMS and ×6 analog gain.

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PB - SPIE

T2 - 2016 IS&T International Symposium on Electronic Imaging

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ER -

A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique

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