A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique

X. Ge, Bastien Mamdy, A.J.P. Theuwissen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)

Abstract

This paper presents a noise analysis and noise measurementsof n-type and p-type pixels with correlated multiple sampling(CMS) technique. The output noise power spectral density (PSD)of both pixel types with different CMS noise reduction factors havebeen simulated and calculated in the spectral domain. Forvalidation, two groups of test pixel have been fabricated with astate-of-the-art n-type and p-type CMOS image sensor (CIS)technology. The calculated and the measured noise results withCMS show a good agreement. Measurement results also show thatthe n-type and p-type pixels reach a 1.1 e- and 0.88 h+ inputreferredtemporal noise respectively with a board-level 64 timesdigital CMS and ×6 analog gain.
Original languageEnglish
Title of host publicationElectronic Imaging
Subtitle of host publicationImage Sensors and Imaging Systems 2016
PublisherSPIE
Pages1-6
Number of pages6
DOIs
Publication statusPublished - 14 Feb 2016
Event2016 IS&T International Symposium on Electronic Imaging - San Francisco, CA, United States
Duration: 14 Feb 201618 Feb 2016
http://www.electronicimaging.org/

Conference

Conference2016 IS&T International Symposium on Electronic Imaging
CountryUnited States
CitySan Francisco, CA
Period14/02/1618/02/16
Internet address

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