A comparative study of atr-ftir and ft-nir spectroscopy for in-situ concentration monitoring during batch cooling crystallization processes

SS Kadam; E. Windt, van der; P Daudey; HJM Kramer

A comparative study of atr-ftir and ft-nir spectroscopy for in-situ concentration monitoring during batch cooling crystallization processes

SS Kadam, E. Windt, van der, P Daudey, HJM Kramer

Intensified Reaction and Separation Systems

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	2629-2640
Number of pages	12
Journal	Crystal Growth & Design
Volume	10
Issue number	6
Publication status	Published - 2010

Keywords

CWTS JFIS >= 2.00

Cite this

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title = "A comparative study of atr-ftir and ft-nir spectroscopy for in-situ concentration monitoring during batch cooling crystallization processes",

keywords = "CWTS JFIS >= 2.00",

author = "SS Kadam and {Windt, van der}, E. and P Daudey and HJM Kramer",

year = "2010",

language = "English",

volume = "10",

pages = "2629--2640",

journal = "Crystal Growth & Design",

issn = "1528-7483",

publisher = "American Chemical Society (ACS)",

number = "6",

}

TY - JOUR

T1 - A comparative study of atr-ftir and ft-nir spectroscopy for in-situ concentration monitoring during batch cooling crystallization processes

AU - Kadam, SS

AU - Windt, van der, E.

AU - Daudey, P

AU - Kramer, HJM

PY - 2010

Y1 - 2010

KW - CWTS JFIS >= 2.00

M3 - Article

SN - 1528-7483

VL - 10

SP - 2629

EP - 2640

JO - Crystal Growth & Design

JF - Crystal Growth & Design

IS - 6

ER -