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A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs
Guilherme Cardoso Medeiros, Cemil Cem Gursoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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