A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

Guilherme Cardoso Medeiros, Cemil Cem Gursoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

4 Citations (Scopus)
11 Downloads (Pure)

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Engineering & Materials Science

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