A direct measurement scheme of amalgamated aging effects with novel on-chip sensor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Title of host publication21st IFIP/IEEE international conference on very large scale integration
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages1-6
Number of pages6
Publication statusPublished - 2013
EventVLSI-SoC 2013 - Piscataway
Duration: 7 Oct 20139 Oct 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceVLSI-SoC 2013
Period7/10/139/10/13

Cite this

Cucu Laurenciu, N., & Cotofana, SD. (2013). A direct measurement scheme of amalgamated aging effects with novel on-chip sensor. In s.n. (Ed.), 21st IFIP/IEEE international conference on very large scale integration (pp. 1-6). IEEE Society.