A fast algorithm for computing and correcting the CTF for tilted, thick specimen in TEM

LM Voortman, S Stallinga, RHM Schoenmakers, LJ van Vliet, B Rieger

    Research output: Contribution to journalArticleScientificpeer-review

    24 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)1029-1036
    Number of pages8
    JournalUltramicroscopy
    Volume111
    Publication statusPublished - 2011

    Keywords

    • CWTS 0.75 <= JFIS < 2.00

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