A Geiger mode APD fabricated in standard 65nm CMOS technology

E Charbon, HJ Yoon, Y Maruyama

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

20 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings 2013 IEEE International Electron Devices Meeting
EditorsT Ghani, HCH Wang, J Suehle
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-4
Number of pages4
ISBN (Print)978-1-4799-2307-6
DOIs
Publication statusPublished - 2013
EventIEEE IEDM 2013, Washington DC, USA - Piscataway, NJ, USA
Duration: 9 Dec 201311 Dec 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE IEDM 2013, Washington DC, USA
Period9/12/1311/12/13

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