A general Bayes Weibull inference model for accelerated life testing

JR van Dorp, TA Mazzuchi

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	ESREL2003 European safety and reliability conference
Editors	T Bedford, PHAJM van Gelder
Place of Publication	Lisse
Publisher	Swets and Zweitlinger
Pages	559-566
Number of pages	8
ISBN (Print)	90-5809-551-7
Publication status	Published - 2003
Event	European safety and reliability conference, Maastricht, The Netherlands - Lisse Duration: 15 Jun 2003 → 18 Jun 2003

Name
Publisher	Swets and Zweitlinger

Conference	European safety and reliability conference, Maastricht, The Netherlands
Period	15/06/03 → 18/06/03

CD-ROM

Keywords

@inproceedings{6cafe3a30f8c457083331843f097dcef,

title = "A general Bayes Weibull inference model for accelerated life testing",

keywords = "Conf.proc. > 3 pag",

author = "{van Dorp}, JR and TA Mazzuchi",

note = "CD-ROM; European safety and reliability conference, Maastricht, The Netherlands ; Conference date: 15-06-2003 Through 18-06-2003",

year = "2003",

language = "Undefined/Unknown",

isbn = "90-5809-551-7",

publisher = "Swets and Zweitlinger",

pages = "559--566",

editor = "T Bedford and {van Gelder}, PHAJM",

booktitle = "ESREL2003 European safety and reliability conference",

}

TY - GEN

T1 - A general Bayes Weibull inference model for accelerated life testing

AU - van Dorp, JR

AU - Mazzuchi, TA

N1 - CD-ROM

PY - 2003

Y1 - 2003

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 90-5809-551-7

SP - 559

EP - 566

BT - ESREL2003 European safety and reliability conference

A2 - Bedford, T

A2 - van Gelder, PHAJM

PB - Swets and Zweitlinger

CY - Lisse

T2 - European safety and reliability conference, Maastricht, The Netherlands

Y2 - 15 June 2003 through 18 June 2003

ER -