TY - JOUR
T1 - A generalization of dissimilarity representations using feature lines and feature planes
AU - Orozco-Alzate, M
AU - Duin, RPW
AU - Castellanos-Dominiguez, G
PY - 2009
Y1 - 2009
KW - Wiskunde en Informatica
KW - Techniek
KW - technische Wiskunde en Informatica
KW - academic journal papers
KW - CWTS 0.75 <= JFIS < 2.00
UR - http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6V15-4TN0KR0-2&_user=499885&_rdoc=1&_fmt=&_orig=search&_sort=d&view=c&_acct=C000024500&_version=1&_urlVersion=0&_userid=499885&md5=3b75afbdaceabb8da057a839d8d321cc
UR - https://www.scopus.com/pages/publications/57349096374
M3 - Article
SN - 0167-8655
VL - 30
SP - 242
EP - 254
JO - Pattern Recognition Letters
JF - Pattern Recognition Letters
ER -