A hybrid degradation modeling of light-emitting diode using permutation entropy and data-driven methods

Minzhen Wen, Zhou Jing, Mesfin Seid Ibrahim, Jiajie Fan, Guoqi Zhang

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)

Abstract

The LED degradation failure is highly dependent on temperature and this degradation failure is an irreversible energy dissipation process in thermodynamics. In this paper, the entropy generation is used to quantify the energy dissipation, which is regarded as one of the main performance characteristics of LED's degradation process. Considering the thermodynamic characteristics of entropy generation in the LED failure, a hybrid degradation prediction model based on the permutation entropy (PE) and data-driven methods was proposed. Firstly, a thermal aging test was designed for white LEDs in which the entropy generation rates (EGRs) of LEDs were extracted from the online collected thermoelectric performance parameters. Then, the EGRs of LEDs were treated as a time-series signal to perform phase space reconstruction and calculate PEs. Finally, both neural network model and Wiener process based data-driven methods were used to process the PEs. This hybrid model links the thermodynamic entropy of LEDs with its optical performance. The results show that: (1) Entropy generation based on thermodynamics can characterize the degradation process of LEDs; (2) The proposed hybrid degradation prediction model based on the PE and Wiener method can achieve early failure warning of LEDs before the actual failure occurs.
Original languageEnglish
Title of host publication2021 22nd International Conference on Electronic Packaging Technology (ICEPT)
Subtitle of host publicationProceedings
PublisherIEEE
Number of pages6
ISBN (Electronic)978-1-6654-1391-6
ISBN (Print)978-1-6654-1392-3
DOIs
Publication statusPublished - 2021
EventICEPT 2021: 22nd International Conference on Electronic Packaging Technology - Xiamen, China
Duration: 14 Sept 202117 Sept 2021
Conference number: 22nd

Conference

ConferenceICEPT 2021
Country/TerritoryChina
CityXiamen
Period14/09/2117/09/21

Keywords

  • Light-emitting diode
  • Entropy generation
  • Permutation entropy
  • Neural network
  • Wiener process

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