A Linear Model for Microwave Imaging of Highly Conductive Scatterers

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Abstract

In this paper, a linear model based on multiple measurement vectors' model is proposed to formulate the inverse scattering problem of highly conductive objects at one single frequency. Considering the induced currents that are mostly distributed on the boundaries of the scatterers, joint sparse structure is enforced by a sum-of-norm regularization. Since no a priori information is required and no approximation of the scattering model has been made, the proposed method is versatile. Imaging results with transverse magnetic and transverse electric polarized synthetic data and Fresnel data demonstrate its higher resolving ability than both linear sampling method and its improved version with higher, but acceptable, computational complexity.
Original languageEnglish
Pages (from-to)1149-1164
Number of pages16
JournalIEEE Transactions on Microwave Theory and Techniques
Volume66
Issue number3
DOIs
Publication statusPublished - 2018

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • Inverse scattering problem
  • joint sparse structure
  • multiple measurement vectors (MMVs)
  • sum-of-norm regularization constraint
  • transverse electric (TE)
  • transverse magnetic (TM)

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