A low-cost pulsed RF & I-V measurement setup for isothermal device characterization

M. Marchetti; K. Buisman; M. Pelk; L. C.N. De Vreede

doi:10.1109/ARFTG.2007.8376175

A low-cost pulsed RF & I-V measurement setup for isothermal device characterization

M. Marchetti, K. Buisman, M. Pelk, L. C.N. De Vreede

Electronics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Abstract

A low-cost, highly versatile, pulsed RF - pulsed I-V isothermal device characterization setup is presented. The realized setup combines a synthetic instrument high dynamic range pulsed network analyzer with pulsed I-V measurements. The resulting configuration facilitates very accurate characterization of low-power as well as high-power devices over a wide range of bias and pulse conditions. The achieved system accuracy is reported, and its measurement capabilities are highlighted through the characterization of self-heating effects in LDMOS devices and silicon-on-glass VDMOS.

Original language	English
Title of host publication	2007 70th ARFTG Microwave Measurement Conference
Subtitle of host publication	High Power RF Measurement Techniques, ARFTG 2007
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	33-36
Number of pages	4
ISBN (Electronic)	978-1-5386-7295-2
ISBN (Print)	978-1-5386-7296-9
DOIs	https://doi.org/10.1109/ARFTG.2007.8376175
Publication status	Published - 2007
Event	70th ARFTG Microwave Measurement Conference, ARFTG 2007 - Tempe, United States Duration: 29 Nov 2007 → 30 Nov 2007

Conference

Conference	70th ARFTG Microwave Measurement Conference, ARFTG 2007
Country/Territory	United States
City	Tempe
Period	29/11/07 → 30/11/07

Keywords

Device characterization
Dynamic range
Isothermal
Pulsed measurements

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10.1109/ARFTG.2007.8376175

Cite this

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title = "A low-cost pulsed RF & I-V measurement setup for isothermal device characterization",

abstract = "A low-cost, highly versatile, pulsed RF - pulsed I-V isothermal device characterization setup is presented. The realized setup combines a synthetic instrument high dynamic range pulsed network analyzer with pulsed I-V measurements. The resulting configuration facilitates very accurate characterization of low-power as well as high-power devices over a wide range of bias and pulse conditions. The achieved system accuracy is reported, and its measurement capabilities are highlighted through the characterization of self-heating effects in LDMOS devices and silicon-on-glass VDMOS.",

keywords = "Device characterization, Dynamic range, Isothermal, Pulsed measurements",

author = "M. Marchetti and K. Buisman and M. Pelk and {De Vreede}, {L. C.N.}",

year = "2007",

doi = "10.1109/ARFTG.2007.8376175",

language = "English",

isbn = "978-1-5386-7296-9 ",

pages = "33--36",

booktitle = "2007 70th ARFTG Microwave Measurement Conference",

publisher = "IEEE",

address = "United States",

note = "70th ARFTG Microwave Measurement Conference, ARFTG 2007 ; Conference date: 29-11-2007 Through 30-11-2007",

}

Marchetti, M, Buisman, K, Pelk, M & De Vreede, LCN 2007, A low-cost pulsed RF & I-V measurement setup for isothermal device characterization. in 2007 70th ARFTG Microwave Measurement Conference: High Power RF Measurement Techniques, ARFTG 2007. IEEE, Piscataway, NJ, USA, pp. 33-36, 70th ARFTG Microwave Measurement Conference, ARFTG 2007, Tempe, United States, 29/11/07. https://doi.org/10.1109/ARFTG.2007.8376175

A low-cost pulsed RF & I-V measurement setup for isothermal device characterization. / Marchetti, M.; Buisman, K.; Pelk, M. et al.
2007 70th ARFTG Microwave Measurement Conference: High Power RF Measurement Techniques, ARFTG 2007. Piscataway, NJ, USA: IEEE, 2007. p. 33-36.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - A low-cost pulsed RF & I-V measurement setup for isothermal device characterization

AU - Marchetti, M.

AU - Buisman, K.

AU - Pelk, M.

AU - De Vreede, L. C.N.

PY - 2007

Y1 - 2007

N2 - A low-cost, highly versatile, pulsed RF - pulsed I-V isothermal device characterization setup is presented. The realized setup combines a synthetic instrument high dynamic range pulsed network analyzer with pulsed I-V measurements. The resulting configuration facilitates very accurate characterization of low-power as well as high-power devices over a wide range of bias and pulse conditions. The achieved system accuracy is reported, and its measurement capabilities are highlighted through the characterization of self-heating effects in LDMOS devices and silicon-on-glass VDMOS.

AB - A low-cost, highly versatile, pulsed RF - pulsed I-V isothermal device characterization setup is presented. The realized setup combines a synthetic instrument high dynamic range pulsed network analyzer with pulsed I-V measurements. The resulting configuration facilitates very accurate characterization of low-power as well as high-power devices over a wide range of bias and pulse conditions. The achieved system accuracy is reported, and its measurement capabilities are highlighted through the characterization of self-heating effects in LDMOS devices and silicon-on-glass VDMOS.

KW - Device characterization

KW - Dynamic range

KW - Isothermal

KW - Pulsed measurements

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U2 - 10.1109/ARFTG.2007.8376175

DO - 10.1109/ARFTG.2007.8376175

M3 - Conference contribution

AN - SCOPUS:85049960054

SN - 978-1-5386-7296-9

SP - 33

EP - 36

BT - 2007 70th ARFTG Microwave Measurement Conference

PB - IEEE

CY - Piscataway, NJ, USA

T2 - 70th ARFTG Microwave Measurement Conference, ARFTG 2007

Y2 - 29 November 2007 through 30 November 2007

ER -

A low-cost pulsed RF & I-V measurement setup for isothermal device characterization

Abstract

Conference

Keywords

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