A method for computing total downtime distributions in repairable systems

X Suyono, JAM van der Weide

Research output: Contribution to journalArticleScientificpeer-review

5 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)643-653
Number of pages11
JournalJournal of Applied Probability
Volume40
Publication statusPublished - 2003

Keywords

  • ZX CWTS JFIS < 1.00

Cite this