A model-based approach to fault diagnosis of embedded systems

J Pietersma, AJC van Gemund, A Bos

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationASCI 2004 Proceedings of the tenth annual conference of the Advanced School for Computing and Imaging
EditorsJJ van Wijk, JWJ Heijnsdijk, KG Langendoen, R Veltkamp
Place of PublicationDelft
PublisherAdvanced School for Computing and Imaging (ASCI)
Pages189-196
Number of pages8
ISBN (Print)90-803086-9-2
Publication statusPublished - 2004
EventTenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands - Delft
Duration: 2 Jun 20044 Jun 2004

Publication series

Name
PublisherAdvanced School for Computing and imaging (ASCI)

Conference

ConferenceTenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands
Period2/06/044/06/04

Keywords

  • Vakpubl., Overig wet. > 3 pag

Cite this

Pietersma, J., van Gemund, AJC., & Bos, A. (2004). A model-based approach to fault diagnosis of embedded systems. In JJ. van Wijk, JWJ. Heijnsdijk, KG. Langendoen, & R. Veltkamp (Eds.), ASCI 2004 Proceedings of the tenth annual conference of the Advanced School for Computing and Imaging (pp. 189-196). Advanced School for Computing and Imaging (ASCI).