A model-based approach to sequential fault diagnosis

J Pietersma, AJC van Gemund, A Bos

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

14 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationAutotestcon 2005 Proceedings
EditorsS Karlovic, D Wallhermfechtel
Place of PublicationPiscataway
PublisherIEEE Society
Pages621-627
Number of pages7
ISBN (Print)0-7803-9102-0
Publication statusPublished - 2005
EventAutotestcon 2005 IEEE Systems Readiness Technology Conference, Orlando, FL, USA - Piscataway
Duration: 26 Sep 200529 Sep 2005

Publication series

Name
PublisherIEEE

Conference

ConferenceAutotestcon 2005 IEEE Systems Readiness Technology Conference, Orlando, FL, USA
Period26/09/0529/09/05

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this

Pietersma, J., van Gemund, AJC., & Bos, A. (2005). A model-based approach to sequential fault diagnosis. In S. Karlovic, & D. Wallhermfechtel (Eds.), Autotestcon 2005 Proceedings (pp. 621-627). IEEE Society.