A model-based approach to sequential fault diagnosis

J Pietersma, AJC van Gemund, A Bos

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

18 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Autotestcon 2005 Proceedings
Editors	S Karlovic, D Wallhermfechtel
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	621-627
Number of pages	7
ISBN (Print)	0-7803-9102-0
Publication status	Published - 2005
Event	Autotestcon 2005 IEEE Systems Readiness Technology Conference, Orlando, FL, USA - Piscataway Duration: 26 Sept 2005 → 29 Sept 2005

Name
Publisher	IEEE

Conference	Autotestcon 2005 IEEE Systems Readiness Technology Conference, Orlando, FL, USA
Period	26/09/05 → 29/09/05

Keywords

@inproceedings{14609811a94543e88474fc7353bb41e3,

title = "A model-based approach to sequential fault diagnosis",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "J Pietersma and {van Gemund}, AJC and A Bos",

year = "2005",

language = "Undefined/Unknown",

isbn = "0-7803-9102-0",

publisher = "IEEE Society",

pages = "621--627",

editor = "S Karlovic and D Wallhermfechtel",

booktitle = "Autotestcon 2005 Proceedings",

note = "Autotestcon 2005 IEEE Systems Readiness Technology Conference, Orlando, FL, USA ; Conference date: 26-09-2005 Through 29-09-2005",

}

TY - GEN

T1 - A model-based approach to sequential fault diagnosis

AU - Pietersma, J

AU - van Gemund, AJC

AU - Bos, A

PY - 2005

Y1 - 2005

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7803-9102-0

SP - 621

EP - 627

BT - Autotestcon 2005 Proceedings

A2 - Karlovic, S

A2 - Wallhermfechtel, D

PB - IEEE Society

CY - Piscataway

T2 - Autotestcon 2005 IEEE Systems Readiness Technology Conference, Orlando, FL, USA

Y2 - 26 September 2005 through 29 September 2005

ER -