A model-based approach to sequential fault diagnosis

J Pietersma, AJC van Gemund, A Bos

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

16 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationAutotestcon 2005 Proceedings
EditorsS Karlovic, D Wallhermfechtel
Place of PublicationPiscataway
PublisherIEEE Society
Pages621-627
Number of pages7
ISBN (Print)0-7803-9102-0
Publication statusPublished - 2005
EventAutotestcon 2005 IEEE Systems Readiness Technology Conference, Orlando, FL, USA - Piscataway
Duration: 26 Sep 200529 Sep 2005

Publication series

Name
PublisherIEEE

Conference

ConferenceAutotestcon 2005 IEEE Systems Readiness Technology Conference, Orlando, FL, USA
Period26/09/0529/09/05

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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