A Model-Based Approach to Sequential Fault Diagnosis

J Pietersma, AJC van Gemund, A Bos

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	46-52
Number of pages	7
Journal	IEEE Instrumentation and Measurement Magazine
Volume	10
Publication status	Published - 2007

Cite this

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title = "A Model-Based Approach to Sequential Fault Diagnosis",

keywords = "Wiskunde en Informatica, Techniek, technische Wiskunde en Informatica, CWTS JFIS < 0.75",

author = "J Pietersma and {van Gemund}, AJC and A Bos",

note = "pietersma2007a",

year = "2007",

language = "Undefined/Unknown",

volume = "10",

pages = "46--52",

journal = "IEEE Instrumentation and Measurement Magazine",

issn = "1094-6969",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

}

TY - JOUR

T1 - A Model-Based Approach to Sequential Fault Diagnosis

AU - Pietersma, J

AU - van Gemund, AJC

AU - Bos, A

N1 - pietersma2007a

PY - 2007

Y1 - 2007

KW - Wiskunde en Informatica

KW - Techniek

KW - technische Wiskunde en Informatica

KW - CWTS JFIS < 0.75

M3 - Article

VL - 10

SP - 46

EP - 52

JO - IEEE Instrumentation and Measurement Magazine

JF - IEEE Instrumentation and Measurement Magazine

SN - 1094-6969

ER -