A modified blister test to study the adhesion of thin coatings based on local helium ion implantation

R Escobar Galindo, A van Veen, JH Evans, H Schut, ThM Hosson

Research output: Contribution to journalArticleScientificpeer-review

25 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)170-176
Number of pages7
JournalThin Solid Films
Publication statusPublished - 2005


  • ZX CWTS 1.00 <= JFIS < 3.00

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