A new extraction technique for the series resistance of semiconductor devices based on the intrinsic properties of bias-dependent Y-parameters

V Cuoco, WCE Neo, LCN de Vreede, HC de Graaff, LK Nanver, HC Wu, HFF Jos, JN Burghartz

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings Bipolar/BiCMOS Circuits and Technology Meeting 2004
Place of PublicationPiscataway
PublisherIEEE Society
Pages148-151
Number of pages4
ISBN (Print)0-7803-8618-3
Publication statusPublished - 2004
EventBipolar/BiCMOS Circuits and Technology Meeting 2004, Montreal, Canada - Piscataway
Duration: 12 Sep 200414 Sep 2004

Publication series

Name
PublisherIEEE

Conference

ConferenceBipolar/BiCMOS Circuits and Technology Meeting 2004, Montreal, Canada
Period12/09/0414/09/04

Bibliographical note

delen ECTM/HiTeC??/ ed. is niet bekend

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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