A new sharpness measure based on Gaussian lines and edges

J Dijk, M van Ginkel, RJ van Asselt, LJ van Vliet, PW Verbeek

    Research output: Contribution to journalArticleScientificpeer-review

    26 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)149-156
    Number of pages8
    JournalLecture Notes in Computer Science
    Volume2756
    Publication statusPublished - 2003

    Keywords

    • ZX CWTS JFIS < 1.00

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