A new sharpness measure based on Gaussian lines and edges

J Dijk, M van Ginkel, RJ van Asselt, LJ van Vliet, PW Verbeek

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	149-156
Number of pages	8
Journal	Lecture Notes in Computer Science
Volume	2756
Publication status	Published - 2003

Keywords

@article{1778697f0d7940e3abef09aa0e2cbd9c,

title = "A new sharpness measure based on Gaussian lines and edges",

keywords = "ZX CWTS JFIS < 1.00",

author = "J Dijk and {van Ginkel}, M and {van Asselt}, RJ and {van Vliet}, LJ and PW Verbeek",

year = "2003",

language = "Undefined/Unknown",

volume = "2756",

pages = "149--156",

journal = "Lecture Notes in Computer Science",

issn = "0302-9743",

publisher = "Springer",

}