A Novel Calibration Method for Active Interferometer-Based VNAs

F. A. Mubarak; R. Romano; G. Rietveld; M. Spirito

doi:10.1109/LMWC.2020.3006701

A Novel Calibration Method for Active Interferometer-Based VNAs

F. A. Mubarak, R. Romano, G. Rietveld, M. Spirito

Electronics

Research output: Contribution to journal › Article › Scientific › peer-review

2 Citations (Scopus)

Abstract

The addition of RF interferometers to vector network analyzer (VNA) test benches has allowed for realization of low-noise high-frequency measurements of extreme impedance devices. However, when employing correction techniques such as the short-open-load method, the RF response of the interferometer hardware introduces measurement inaccuracies due to unwanted load-dependent inconsistencies. This letter presents a novel VNA calibration method that enables both low-noise and accurate small-signal characterization of highly mismatched devices. The proposed solution is experimentally validated in the 10-18-GHz band, confirming a 23-fold improvement in measurement resolution with absolute accuracy across the entire Γ range of the VNA. The accuracy of the new calibration process is verified via comparison with traceable reference standards supported by state-of-the-art uncertainties.

Original language	English
Article number	9139196
Pages (from-to)	829-832
Number of pages	4
Journal	IEEE Microwave and Wireless Components Letters
Volume	30
Issue number	8
DOIs	https://doi.org/10.1109/LMWC.2020.3006701
Publication status	Published - 2020

Keywords

Calibration
extreme impedance measurement
impedance mismatch
measurement
microwave interferometry
nanoelectronics
nanostructures
noise
traceability
vector network analyzer (VNA)

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10.1109/LMWC.2020.3006701

Cite this

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title = "A Novel Calibration Method for Active Interferometer-Based VNAs",

abstract = "The addition of RF interferometers to vector network analyzer (VNA) test benches has allowed for realization of low-noise high-frequency measurements of extreme impedance devices. However, when employing correction techniques such as the short-open-load method, the RF response of the interferometer hardware introduces measurement inaccuracies due to unwanted load-dependent inconsistencies. This letter presents a novel VNA calibration method that enables both low-noise and accurate small-signal characterization of highly mismatched devices. The proposed solution is experimentally validated in the 10-18-GHz band, confirming a 23-fold improvement in measurement resolution with absolute accuracy across the entire Γ range of the VNA. The accuracy of the new calibration process is verified via comparison with traceable reference standards supported by state-of-the-art uncertainties.",

keywords = "Calibration, extreme impedance measurement, impedance mismatch, measurement, microwave interferometry, nanoelectronics, nanostructures, noise, traceability, vector network analyzer (VNA)",

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AU - Mubarak, F. A.

AU - Romano, R.

AU - Rietveld, G.

AU - Spirito, M.

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AB - The addition of RF interferometers to vector network analyzer (VNA) test benches has allowed for realization of low-noise high-frequency measurements of extreme impedance devices. However, when employing correction techniques such as the short-open-load method, the RF response of the interferometer hardware introduces measurement inaccuracies due to unwanted load-dependent inconsistencies. This letter presents a novel VNA calibration method that enables both low-noise and accurate small-signal characterization of highly mismatched devices. The proposed solution is experimentally validated in the 10-18-GHz band, confirming a 23-fold improvement in measurement resolution with absolute accuracy across the entire Γ range of the VNA. The accuracy of the new calibration process is verified via comparison with traceable reference standards supported by state-of-the-art uncertainties.

KW - Calibration

KW - extreme impedance measurement

KW - impedance mismatch

KW - measurement

KW - microwave interferometry

KW - nanoelectronics

KW - nanostructures

KW - noise

KW - traceability

KW - vector network analyzer (VNA)

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DO - 10.1109/LMWC.2020.3006701

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JO - IEEE Microwave and Wireless Components Letters

JF - IEEE Microwave and Wireless Components Letters

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ER -

A Novel Calibration Method for Active Interferometer-Based VNAs

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Keywords

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