A Novel Calibration Method for Active Interferometer-Based VNAs

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The addition of RF interferometers to vector network analyzer (VNA) test benches has allowed for realization of low-noise high-frequency measurements of extreme impedance devices. However, when employing correction techniques such as the short-open-load method, the RF response of the interferometer hardware introduces measurement inaccuracies due to unwanted load-dependent inconsistencies. This letter presents a novel VNA calibration method that enables both low-noise and accurate small-signal characterization of highly mismatched devices. The proposed solution is experimentally validated in the 10-18-GHz band, confirming a 23-fold improvement in measurement resolution with absolute accuracy across the entire Γ range of the VNA. The accuracy of the new calibration process is verified via comparison with traceable reference standards supported by state-of-the-art uncertainties.
Original languageEnglish
Article number9139196
Pages (from-to)829-832
Number of pages4
JournalIEEE Microwave and Wireless Components Letters
Issue number8
Publication statusPublished - 2020


  • Calibration
  • extreme impedance measurement
  • impedance mismatch
  • measurement
  • microwave interferometry
  • nanoelectronics
  • nanostructures
  • noise
  • traceability
  • vector network analyzer (VNA)

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