A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation

Bo Sun, Xuejun Fan, Huaiyu Ye, Jiajie Fan, Cheng Qian, Williem van Driel, G.Q. Zhang

Research output: Contribution to journalArticleScientificpeer-review

21 Citations (Scopus)
24 Downloads (Pure)

Abstract

In this paper, an integrated LED lamp with an electrolytic capacitor-free driver is considered to study the coupling effects of both LED and driver's degradations on lamp's lifetime. An electrolytic capacitor-less buck-boost driver is used. The physics of failure (PoF) based electronic thermal simulation is carried out to simulate the lamp's lifetime in three different scenarios: Scenario 1 considers LED degradation only, Scenario 2 considers the driver degradation only, and Scenario 3 considers both degradations from LED and driver simultaneously. When these two degradations are both considered, the lamp's lifetime is reduced by about 22% compared to the initial target of 25,000 h. The results of Scenario 1 and 3 are close to each other. Scenario 2 gives erroneous results in terms of luminous flux as the LED's degradation over time is not taken into consideration. This implies that LED's degradation must be taken into considerations when LED and driver's lifetimes are comparable.

Original languageEnglish
Pages (from-to)14-21
Number of pages8
JournalReliability Engineering & System Safety
Volume163
DOIs
Publication statusPublished - 1 Jul 2017

Bibliographical note

Accepted author manuscript

Keywords

  • Degradation
  • Electronic-thermal simulation
  • LED
  • LED driver
  • Lifetime prediction

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