A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

Gianluca Furano, Stefano Di Mascio, Tomasz Szewczyk, Alessandra Menicucci, Luigi Campajola, Francesco Di Capua, Andrea Fabbri, Marco Ottavi

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)

Abstract

This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.

Original languageEnglish
Title of host publication2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages131-134
Number of pages4
ISBN (Electronic)9781509036233
DOIs
Publication statusPublished - 25 Oct 2016
Event29th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 - Storrs, United States
Duration: 19 Sep 201620 Sep 2016

Conference

Conference29th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
CountryUnited States
CityStorrs
Period19/09/1620/09/16

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