A novel silicon interposer for measuring devices requiring complex two-sided contacting

J Derakhshandeh Kheljani, N Golshani, LA Steenweg, W van der Vlist, LK Nanver

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings - 2013 IEEE International Conference on Microelectronic Test Structures
EditorsT Ohguro
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages43-46
Number of pages4
ISBN (Print)978-1-4673-4845-4
DOIs
Publication statusPublished - 2013
Event2013 IEEE CMTS, Osaka, Japan - Piscataway, NJ, USA
Duration: 25 Mar 201328 Mar 2013

Publication series

Name
PublisherIEEE

Conference

Conference2013 IEEE CMTS, Osaka, Japan
Period25/03/1328/03/13

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