A package-integratable six-port reflectometer for power devices

RG Venter, R Hou, K Buisman, M Spirito, K Werner, LCN de Vreede

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings - 2014 IEEE MTT-S International Microwave Symposium
EditorsS Raman, S Barker, D Bedard et al
Place of PublicationNew York, NJ, USA
PublisherIEEE Society
Pages1-4
Number of pages4
ISBN (Print)978-1-4799-3869-8
DOIs
Publication statusPublished - 2014
EventIEEE MTT-S IMS 2014, Tampa Bay, FL, USA - New York, NJ, USA
Duration: 1 Jun 20146 Jun 2014

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE MTT-S IMS 2014, Tampa Bay, FL, USA
Period1/06/146/06/14

Bibliographical note

Harvest

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