A positron beam 2D-ACAR definitive proof of electric-field-assisted positron drift in SiO2 layers: Application to the study of the Si/SiO2 interface

A Rivera, A van Veen, CV Falub, SWH Eijt, H Schut, JMM de Nijs, P Balk

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the 3rd International Workshop on Positron Studies of Semiconductor Defects PSSD
    EditorsM Hasegawa
    Place of PublicationSendai
    PublisherTohoku University
    Pages266-283
    Number of pages18
    Publication statusPublished - 2003
    Event3rd International Workshop on Positron Studies of Semiconductor Defects PSSD-3, Sendai Japan - Sendai
    Duration: 29 Sep 20024 Oct 2002

    Publication series

    Name
    PublisherTohoku University

    Conference

    Conference3rd International Workshop on Positron Studies of Semiconductor Defects PSSD-3, Sendai Japan
    Period29/09/024/10/02

    Keywords

    • conference contrib. refereed
    • Conf.proc. > 3 pag

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