A practical vision on line profile analysis today and in the years to come

R Delhez, AC Vermeulen

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)77-84
    Number of pages8
    JournalZeitschrift fuer Kristallographie: international journal for structural, physical, and chemical aspects of crystalline materials
    Issue number30
    Publication statusPublished - 2009

    Bibliographical note

    NEO

    Keywords

    • CWTS JFIS < 0.75

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