A quantitative evaluation of different STEM imaging modes.

AJ den Dekker, S van Aert, D Van Dyck, A van den Bos

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationInstrumentation and Methodology
    EditorsP Tomanek, R Kolarik
    PublisherCzechoslovak Society for Electron Microscopy
    PagesI 131-I 132
    ISBN (Print)80-238-5501-8
    Publication statusPublished - 2000

    Publication series

    Name
    PublisherCzechoslovak Society for Electron Microscopy
    Name
    Volume3

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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