A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors

R Mikkenie, O Steigelmann, WA Groen, JE ten Elshof

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	167-173
Number of pages	7
Journal	Journal of the American Ceramic Society
Volume	32
Issue number	1
Publication status	Published - 2012

Keywords

@article{96ecf266e3ea430ebb418b950ae12d28,

title = "A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors",

keywords = "Peer-lijst tijdschrift",

author = "R Mikkenie and O Steigelmann and WA Groen and {ten Elshof}, JE",

year = "2012",

language = "English",

volume = "32",

pages = "167--173",

journal = "Journal of the American Ceramic Society",

issn = "0002-7820",

publisher = "Blackwell",

number = "1",

}

TY - JOUR

T1 - A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors

AU - Mikkenie, R

AU - Steigelmann, O

AU - Groen, WA

AU - ten Elshof, JE

PY - 2012

Y1 - 2012

KW - Peer-lijst tijdschrift

M3 - Article

SN - 0002-7820

VL - 32

SP - 167

EP - 173

JO - Journal of the American Ceramic Society

JF - Journal of the American Ceramic Society

IS - 1

ER -