A real time Michelson interferometer for quantitative refractive index profile measurements. Design, validation and utilization

JLM Nijholt

Research output: ThesisDissertation (TU Delft)

Original languageUndefined/Unknown
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Bakker, Peter, Supervisor
Award date3 Feb 2004
Publisher
Print ISBNs90-5623-078-6
Publication statusPublished - 2004

Keywords

  • Diss. prom. aan TU Delft

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