Abstract
In this contribution, we present a rigorous analysis based on uncertainty propagation techniques to estimate the random variation of the controlled reflection coefficient in mixed-signal load-pull test benches. A digital-to-analog converter is commonly used in these test benches to generate the baseband signal required to synthesize the high-frequency, user-defined injected wave. To study the random noise of the injected wave, which can be mapped to the noise of the controlled reflection coefficient, we employ Jacobian sensitivity functions between the baseband signal and the RF one. First, the baseband integrated rms noise of the up-converter is evaluated, and then the upconverted noise is determined via the derived transfer function. Finally, experimental results to validate the uncertainty control bound of the synthesized reflection coefficients are presented, highlighting a full coverage of the measured reflection coefficients.
Original language | English |
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Title of host publication | Proceedings of the 2023 101st ARFTG Microwave Measurement Conference (ARFTG) |
Subtitle of host publication | Challenges in Complex Measurement Environments, ARFTG 2023 |
Publisher | IEEE |
Pages | 1-4 |
Number of pages | 4 |
ISBN (Electronic) | 979-8-3503-2345-0 |
ISBN (Print) | 979-8-3503-2346-7 |
DOIs | |
Publication status | Published - 2023 |
Event | 2023 101st ARFTG Microwave Measurement Conference (ARFTG) - San Diego, United States Duration: 16 Jun 2023 → 16 Jun 2023 Conference number: 101st |
Publication series
Name | 101st ARFTG Microwave Measurement Conference: Challenges in Complex Measurement Environments, ARFTG 2023 |
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Conference
Conference | 2023 101st ARFTG Microwave Measurement Conference (ARFTG) |
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Country/Territory | United States |
City | San Diego |
Period | 16/06/23 → 16/06/23 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Keywords
- S-parameter noise
- frequency domain noise
- residual-error
- noise analysis
- uncertainty analysis
- vector network analyzer (VNA)