A Rigorous Analysis of the Random Noise in Reflection Coefficients Synthesized via Mixed-Signal Active Tuners

Faisal Mubarak*, Fabio Muñoz, Marco Spirito

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Abstract

In this contribution, we present a rigorous analysis based on uncertainty propagation techniques to estimate the random variation of the controlled reflection coefficient in mixed-signal load-pull test benches. A digital-to-analog converter is commonly used in these test benches to generate the baseband signal required to synthesize the high-frequency, user-defined injected wave. To study the random noise of the injected wave, which can be mapped to the noise of the controlled reflection coefficient, we employ Jacobian sensitivity functions between the baseband signal and the RF one. First, the baseband integrated rms noise of the up-converter is evaluated, and then the upconverted noise is determined via the derived transfer function. Finally, experimental results to validate the uncertainty control bound of the synthesized reflection coefficients are presented, highlighting a full coverage of the measured reflection coefficients.
Original languageEnglish
Title of host publicationProceedings of the 2023 101st ARFTG Microwave Measurement Conference (ARFTG)
Subtitle of host publicationChallenges in Complex Measurement Environments, ARFTG 2023
PublisherIEEE
Pages1-4
Number of pages4
ISBN (Electronic)979-8-3503-2345-0
ISBN (Print)979-8-3503-2346-7
DOIs
Publication statusPublished - 2023
Event2023 101st ARFTG Microwave Measurement Conference (ARFTG) - San Diego, United States
Duration: 16 Jun 202316 Jun 2023
Conference number: 101st

Publication series

Name101st ARFTG Microwave Measurement Conference: Challenges in Complex Measurement Environments, ARFTG 2023

Conference

Conference2023 101st ARFTG Microwave Measurement Conference (ARFTG)
Country/TerritoryUnited States
CitySan Diego
Period16/06/2316/06/23

Bibliographical note

Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • S-parameter noise
  • frequency domain noise
  • residual-error
  • noise analysis
  • uncertainty analysis
  • vector network analyzer (VNA)

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