A simplified calibration procedure for on-wafer power levelled S-parameter measurements at mm-wave

S Galbano, L Galatro, M Spirito

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings - 85th ARFTG Microwave Measurement Conference: Measurements and Techniques for 5G Applications
EditorsD Blackham, N Ridler
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-3
Number of pages3
ISBN (Print)978-1-4799-8886-0
DOIs
Publication statusPublished - 2015
EventARFTG 2015, Phoenix, AZ, USA - Piscataway, NJ, USA
Duration: 22 May 201522 May 2015

Publication series

Name
PublisherIEEE

Conference

ConferenceARFTG 2015, Phoenix, AZ, USA
Period22/05/1522/05/15

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