A Single-Temperature Trimming Technique for MOS-Input Operational Amplifiers Achieving 0.33 V/ C Offset Drift

M Bolatkale, MAP Pertijs, WJ Kindt, JH Huijsing, KAA Makinwa

Research output: Contribution to journalArticleScientificpeer-review

8 Citations (Scopus)
Original languageEnglish
Pages (from-to)2099-2107
Number of pages9
JournalIEEE Journal of Solid State Circuits
Volume46
Issue number9
DOIs
Publication statusPublished - 2011

Keywords

  • CWTS JFIS >= 2.00

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