A statistical approach for design and testing of analog circuitry in low-cost SoCs

O Eliezer, RB Staszewski, D Mannath

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)
Original languageEnglish
Title of host publicationProc. of 53rd IEEE Int. Midwest Symp. on Circuits and Systems
Editors s.n.
Place of PublicationSeattle, WA, USA
PublisherIEEE Society
Pages461-464
Number of pages4
Publication statusPublished - 2010
EventMWSCAS 2010 - Seattle, WA, USA
Duration: 1 Aug 20104 Aug 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceMWSCAS 2010
Period1/08/104/08/10

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this

Eliezer, O., Staszewski, RB., & Mannath, D. (2010). A statistical approach for design and testing of analog circuitry in low-cost SoCs. In s.n. (Ed.), Proc. of 53rd IEEE Int. Midwest Symp. on Circuits and Systems (pp. 461-464). IEEE Society.