A statistical approach for design and testing of analog circuitry in low-cost SoCs

O Eliezer, RB Staszewski, D Mannath

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

Original language	English
Title of host publication	Proc. of 53rd IEEE Int. Midwest Symp. on Circuits and Systems
Editors	s.n.
Place of Publication	Seattle, WA, USA
Publisher	IEEE Society
Pages	461-464
Number of pages	4
Publication status	Published - 2010
Event	MWSCAS 2010 - Seattle, WA, USA Duration: 1 Aug 2010 → 4 Aug 2010

Name
Publisher	IEEE

Conference	MWSCAS 2010
Period	1/08/10 → 4/08/10

Keywords

@inproceedings{f6c7d18fd2744478a87d4f9a8fec224f,

title = "A statistical approach for design and testing of analog circuitry in low-cost SoCs",

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author = "O Eliezer and RB Staszewski and D Mannath",

year = "2010",

language = "English",

publisher = "IEEE Society",

pages = "461--464",

editor = "s.n.",

booktitle = "Proc. of 53rd IEEE Int. Midwest Symp. on Circuits and Systems",

note = "MWSCAS 2010 ; Conference date: 01-08-2010 Through 04-08-2010",

}

A statistical approach for design and testing of analog circuitry in low-cost SoCs. / Eliezer, O; Staszewski, RB; Mannath, D.
Proc. of 53rd IEEE Int. Midwest Symp. on Circuits and Systems. ed. / s.n. Seattle, WA, USA: IEEE Society, 2010. p. 461-464.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - A statistical approach for design and testing of analog circuitry in low-cost SoCs

AU - Eliezer, O

AU - Staszewski, RB

AU - Mannath, D

PY - 2010

Y1 - 2010

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 461

EP - 464

BT - Proc. of 53rd IEEE Int. Midwest Symp. on Circuits and Systems

A2 - s.n., null

PB - IEEE Society

CY - Seattle, WA, USA

T2 - MWSCAS 2010

Y2 - 1 August 2010 through 4 August 2010

ER -