A statistical shape model without using landmarks

FM Vos, PW de Bruin, J.G.M. Aubel, G.J. Streekstra, M. Maas, LJ van Vliet, AM Vossepoel

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

17 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings 17th International Conference on Pattern Recognition
EditorsJ. Kittler, M. Petrou, M. Nixon
Place of PublicationLos Alamitos
PublisherIEEE
Pages714-717
Number of pages4
ISBN (Print)0-7695-2128-2
Publication statusPublished - 2004
Event17th International Conference on Pattern Recognition - Los Alamitos
Duration: 23 Aug 200426 Aug 2004

Publication series

Name
PublisherIEEE Computer Society Press
NameInternational Conference on Pattern Recognition
Volume3
ISSN (Print)1051-4651

Conference

Conference17th International Conference on Pattern Recognition
Period23/08/0426/08/04

Keywords

  • Conf.proc. > 3 pag

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