A stochastic deterioration process for time-dependent reliability analysis

JM van Noortwijk; MD Pandey

A stochastic deterioration process for time-dependent reliability analysis

JM van Noortwijk, MD Pandey

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the eleventh IFIP WG7.5 working conference on reliability and optimization of structural systems
Editors	MA Maes, L Huyse
Place of Publication	Leiden
Publisher	CRC Press / Balkema - Taylor & Francis Group
Pages	259-265
Number of pages	7
ISBN (Print)	90-5809-579-7
Publication status	Published - 2004
Event	Eleventh IFIP WG7.5 working conference on reliability and optimization of structural systems, Banff, Canada - Leiden Duration: 2 Nov 2003 → 5 Nov 2003

Publication series

Name
Publisher	Balkema

Conference

Conference	Eleventh IFIP WG7.5 working conference on reliability and optimization of structural systems, Banff, Canada
Period	2/11/03 → 5/11/03

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{a03386a4640a45aab1d9cf93b1c7074a,

title = "A stochastic deterioration process for time-dependent reliability analysis",

keywords = "Conf.proc. > 3 pag",

author = "{van Noortwijk}, JM and MD Pandey",

year = "2004",

language = "Undefined/Unknown",

isbn = "90-5809-579-7",

publisher = "CRC Press / Balkema - Taylor & Francis Group",

pages = "259--265",

editor = "MA Maes and L Huyse",

booktitle = "Proceedings of the eleventh IFIP WG7.5 working conference on reliability and optimization of structural systems",

note = "Eleventh IFIP WG7.5 working conference on reliability and optimization of structural systems, Banff, Canada ; Conference date: 02-11-2003 Through 05-11-2003",

}

van Noortwijk, JM & Pandey, MD 2004, A stochastic deterioration process for time-dependent reliability analysis. in MA Maes & L Huyse (eds), Proceedings of the eleventh IFIP WG7.5 working conference on reliability and optimization of structural systems. CRC Press / Balkema - Taylor & Francis Group, Leiden, pp. 259-265, Eleventh IFIP WG7.5 working conference on reliability and optimization of structural systems, Banff, Canada, 2/11/03.

A stochastic deterioration process for time-dependent reliability analysis. / van Noortwijk, JM; Pandey, MD.
Proceedings of the eleventh IFIP WG7.5 working conference on reliability and optimization of structural systems. ed. / MA Maes; L Huyse. Leiden: CRC Press / Balkema - Taylor & Francis Group, 2004. p. 259-265.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - A stochastic deterioration process for time-dependent reliability analysis

AU - van Noortwijk, JM

AU - Pandey, MD

PY - 2004

Y1 - 2004

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 90-5809-579-7

SP - 259

EP - 265

BT - Proceedings of the eleventh IFIP WG7.5 working conference on reliability and optimization of structural systems

A2 - Maes, MA

A2 - Huyse, L

PB - CRC Press / Balkema - Taylor & Francis Group

CY - Leiden

T2 - Eleventh IFIP WG7.5 working conference on reliability and optimization of structural systems, Banff, Canada

Y2 - 2 November 2003 through 5 November 2003

ER -