A stochastic deterioration process for time-dependent reliability analysis

JM van Noortwijk, MD Pandey

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the eleventh IFIP WG7.5 working conference on reliability and optimization of structural systems
    EditorsMA Maes, L Huyse
    Place of PublicationLeiden
    PublisherCRC Press / Balkema - Taylor & Francis Group
    Pages259-265
    Number of pages7
    ISBN (Print)90-5809-579-7
    Publication statusPublished - 2004
    EventEleventh IFIP WG7.5 working conference on reliability and optimization of structural systems, Banff, Canada - Leiden
    Duration: 2 Nov 20035 Nov 2003

    Publication series

    Name
    PublisherBalkema

    Conference

    ConferenceEleventh IFIP WG7.5 working conference on reliability and optimization of structural systems, Banff, Canada
    Period2/11/035/11/03

    Keywords

    • Conf.proc. > 3 pag

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