A stochastic process model for computing the cost of a condition-based maintenance plan

JAM van der Weide; MD Pandey; JM van Noortwijk

A stochastic process model for computing the cost of a condition-based maintenance plan

JAM van der Weide, MD Pandey, JM van Noortwijk

Applied Probability

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Safety, reliability and risk analysis
Editors	S Martorell, C Guedes Soares, J Barnett
Place of Publication	Leiden
Publisher	CRC Press / Balkema - Taylor & Francis Group
Pages	431-439
Number of pages	9
ISBN (Print)	9780415485135
Publication status	Published - 2008
Event	17th European safety and reliability conference ESREL, Valencia, Spain - Leiden Duration: 22 Sept 2008 → 25 Sept 2008

Publication series

Name
Publisher	CRC Press / Balkema

Name
Volume	1

Conference

Conference	17th European safety and reliability conference ESREL, Valencia, Spain
Period	22/09/08 → 25/09/08

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{ad91fbf0e9194d61b833ded78a61d838,

title = "A stochastic process model for computing the cost of a condition-based maintenance plan",

keywords = "Conf.proc. > 3 pag",

author = "{van der Weide}, JAM and MD Pandey and {van Noortwijk}, JM",

year = "2008",

language = "Undefined/Unknown",

isbn = "9780415485135",

publisher = "CRC Press / Balkema - Taylor & Francis Group",

pages = "431--439",

editor = "S Martorell and {Guedes Soares}, C and J Barnett",

booktitle = "Safety, reliability and risk analysis",

note = "17th European safety and reliability conference ESREL, Valencia, Spain ; Conference date: 22-09-2008 Through 25-09-2008",

}

van der Weide, JAM, Pandey, MD & van Noortwijk, JM 2008, A stochastic process model for computing the cost of a condition-based maintenance plan. in S Martorell, C Guedes Soares & J Barnett (eds), Safety, reliability and risk analysis. CRC Press / Balkema - Taylor & Francis Group, Leiden, pp. 431-439, 17th European safety and reliability conference ESREL, Valencia, Spain, 22/09/08.

A stochastic process model for computing the cost of a condition-based maintenance plan. / van der Weide, JAM; Pandey, MD; van Noortwijk, JM.
Safety, reliability and risk analysis. ed. / S Martorell; C Guedes Soares; J Barnett. Leiden: CRC Press / Balkema - Taylor & Francis Group, 2008. p. 431-439.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - A stochastic process model for computing the cost of a condition-based maintenance plan

AU - van der Weide, JAM

AU - Pandey, MD

AU - van Noortwijk, JM

PY - 2008

Y1 - 2008

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 9780415485135

SP - 431

EP - 439

BT - Safety, reliability and risk analysis

A2 - Martorell, S

A2 - Guedes Soares, C

A2 - Barnett, J

PB - CRC Press / Balkema - Taylor & Francis Group

CY - Leiden

T2 - 17th European safety and reliability conference ESREL, Valencia, Spain

Y2 - 22 September 2008 through 25 September 2008

ER -