@inproceedings{53d7fa9a4f074bff873d6a1984b0a9b6,
title = "A study of cross-bridge kelvin resistor structures for reliable measurement of low contact resistances",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "N Stavitski and JH Klootwijk and {van Zeijl}, HW and AY Kovalging and RAM Wolters",
year = "2008",
language = "Undefined/Unknown",
isbn = "978-1-4244-1801-5",
publisher = "IEEE Society",
pages = "199--204",
editor = "s.n",
booktitle = "Proceedings of the 21st International Conference on Microelectronic Test structures (ICMTS)",
note = "2008 IEEE International Conference on Microelectronic Test structures (ICMTS), Edinburgh, Schotland ; Conference date: 24-03-2008 Through 27-03-2008",
}